PRODUCT CENTER
Precision optics, semiconductor measurement, semiconductor optics, etc
3D stripe free, customizable for high optical uniformity and low stress birefringence
Metal impurity content(Unit: ppm)
| Metal impurity content | Li | Na | K | Mg | Ca | Cu | Al | Cr | Fe | Ti | Total | OH |
| YS-1330 | ≤0.001 | ≤0.005 | ≤0.005 | ≤0.005 | ≤0.005 | ≤0.001 | ≤0.005 | ≤0.001 | ≤0.001 | ≤0.008 | <0.05 | <100 |
Product Features
| Model | Optical uniformity | Stress birefringence (nm/cm) | Bubble | Stripe level |
| YS-1330 | ≤5 | ≤5 | 0 | 5 |
Optical transmittance
Mechanical performance
| Parameter | Company | Test result |
Density | g/cm3 | 2.20 |
| Mohs hardness | - | 7 |
| Young's modulus | GPa | 74.20 |
| Shear modulus | GPa | 31.22 |
| Poisson's ratio | - | 0.17 |
| compressive strength | GPa | 1.13 |
| Tensile strength | MPa | 49 |
| Bending strength | MPa | 94.3 |
Electrical performance
Parameter | Company | Test result |
| Dielectric constant (20 ° C, 500MHz) | - | 3.9 |
| Electrical resistivity (20 ° C) | Ω·cm | 0.1*1018 |
| Dielectric loss angle (tan δ, 500MHz) | - | <0.001 |
| Resistance | Ω | 8.0*1015 |
Thermal Properties
Parameter | Company | Test result |
Strain point (η=1014.5dPa·s) | °C | 1000 |
| Annealing point (η=1013dPa·s) | °C | 1160 |
| Softening point (η=107.6dPa·s) | °C | 1620 |
Copyright (C) 2024 QUARTECS Co., Ltd. All rights reserved ICP备案号：
