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YSM series quartz mask substrate

应用领域

Mask template substrate

产品优势

Extremely high UV transmittance, very low impurity content, no bubbles, high surface quality

规格参数

optical performance


• ppb purity, hydroxyl content<250ppm, ensuring good optical transmittance

• ArF 193nm > 90.2%

•KrF 248nm > 92%

• I-line 365nm > 92.5%

•g-line 436nm > 92.7%

Internal transmittance ≥ 99.5%/cm @ 193nm

Ensure good stress control and optical uniformity through preparation and processing techniques

Optical Transmittance Performance


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Processing indicators


Capable of processing and testing quartz substrates for semiconductor masks

Multi line cutting

Double sided grinding and polishing

Ultrasonic cleaning, deep cleaning

• Defect detection

• Uniformity


Typical test values (test method: atomic force microscope)


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Surface roughness test (10)μm*10μm)


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index

Typical values

Rough machining value

Roughness Ra

≤0.2nm<0.5nm

Surface PV

≤ 2 (upper and lower surfaces)

TTV

≤2μm

≤5μm