应用领域
Mask template substrate
产品优势
Extremely high UV transmittance, very low impurity content, no bubbles, high surface quality
Mask template substrate
Extremely high UV transmittance, very low impurity content, no bubbles, high surface quality
optical performance
• ppb purity, hydroxyl content<250ppm, ensuring good optical transmittance
• ArF 193nm > 90.2%
•KrF 248nm > 92%
• I-line 365nm > 92.5%
•g-line 436nm > 92.7%
Internal transmittance ≥ 99.5%/cm @ 193nm
Ensure good stress control and optical uniformity through preparation and processing techniques
Optical Transmittance Performance
Processing indicators
Capable of processing and testing quartz substrates for semiconductor masks
Multi line cutting
Double sided grinding and polishing
Ultrasonic cleaning, deep cleaning
• Defect detection
• Uniformity
Typical test values (test method: atomic force microscope)
Surface roughness test (10)μm*10μm)
index | Typical values | Rough machining value |
Roughness Ra | ≤0.2nm | <0.5nm |
Surface PV | ≤ 2 (upper and lower surfaces) | |
TTV | ≤2μm | ≤5μm |
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